[1] NYLANDER C, LIEDBERG B, LIND T. Gas detection by means of surface plasmons resonance［J］. Sensors and Actuators B, 1982, 3: 79-88.

[2] LIEBERG B, NYLANDER C, LUNDSTROM I. Surface plasmon resonance for gas detection and biosensing［J］. Sensors and Actuators, 1983, 4: 299-304.

[3] KRETSCHMANN E. The determination of the optical constants of metals by excitation of surface plasmons［J］. Z Phys, 1971, 241: 313-324.

[4] HOLLSTEIN T, KREIBIG U, LEIS F. Optical properties of Cu and Ag in the intermediate region between pure drude and interband absorption［J］. Phys Status Solidi B, 1977, 82(2): 545-556.

[5] BARKER A S. Response functions for surface polaritons at interfaces in solids［J］. Surf Sci, 1973, 34(1): 62-72.

[6] BOSENBERG J. Photoelectrons from optically excited nonradiative surface plasma oscillations［J］. Phys Lett, 1971, 37A(5): 439-440.

[7] KOU E F Y,TAMIR T. Incidence angles for optimized ATR excitation of surface plasmons［J］. Appl Opt, 1988, 27(19): 4098-4103.

[8] KRETSCHMANN E, RAETHER H. Radiative decay of non-radiative surface plasmons excited by light［J］. Z Naturforsch, 1968, 23A: 2135-2136.

[9] CHEN W P, CHEN J M. Use of surface plasma waves for determination of the thickness and optical constants of thin metallic film［J］. J Opt Soc Am, 1981, 71(2): 189-191.

[10] YANG Fu-zi, CAO Zhuang-qi, FANG Jun-xin. Method of two-dielectric coating for determination of thickness and optical constants of thin metallic films［J］. Acta Optica Sinica, 1986, 6(10): 948-953.

[11] FAN Zheng-xiu, YANG Ben-qi. Computation method for analyzing ellipsometric equation of optical thin films［J］. Acta Optica Sinica, 1984, 4(10): 939-945.

[12] HOR Y S, CHANG C S, LUE J T. Ellipsometry study of thin metallic films under constraint by the side effect［J］. Appl Phys A, 1998, 67(5): 531-539.

[13] GU Zheng-tian, LIANG Pei-hui, LIU Xiao-lin, et al. Optimization of optical parameters of the film sensor based on p-polarized reflectance［J］. Acta Optica Sinica, 1999, 19(11): 1556-1562.

[14] GU Zheng-tian, LIANG Pei-hui, LIU Xiao-lin, et al. Influence of glass surface layer on measurement of optical parameters of thin films［J］. Acta Photonica Sinica, 1999, 28(5): 465-472.

[15] XIAO Bing-gang, SONG Jun, HE Sai-ling. Theoretical and experimental analysis for measuring the refractive index and thickness of a film in a leakage waveguide［J］. Acta Photonica Sinica, 2005, 34(4): 586-589.

[16] LIN Yong-chang, LU Wei-qiang. Principles of optical thin films［M］. Beijing: National Defence Industry Press, 1990: 56-90.