• Chinese Journal of Lasers
  • Vol. 38, Issue 11, 1115001 (2011)
Xiang Dong1、2、*, Wang Qingling3, Wang Xicheng1, Li Tieping1, Wei Youfeng1, and Luo Zhongjie1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.3788/cjl201138.1115001 Cite this Article Set citation alerts
    Xiang Dong, Wang Qingling, Wang Xicheng, Li Tieping, Wei Youfeng, Luo Zhongjie. Enhanced Raman Scattering by Nano Gate Electrode[J]. Chinese Journal of Lasers, 2011, 38(11): 1115001 Copy Citation Text show less

    Abstract

    In order to better understand the mechanism of surface enhanced Raman spectroscopy (SERS) and further improve the Raman enhancement factor, a strategy which combines SERS and mechanical controllable break junctions (MCBJ) is employed. With such a strategy, the gap width between two nanoelectrodes can be adjusted precisely during the period of SERS measurement. The dependence of SERS intensity on the gap width and the incident laser polarization are investigated. Moreover, a nano gate-electrode with adjustable bias voltage is introduced, and the gate electrode effect to the Raman signal intensity is investigated in system. The experimental results demonstrate that the Raman signal intensity critically depends on the biased gate voltage, which provide a new method to enhance the Raman signal and benefit the theory investigation for the Raman enhancement mechanism.
    Xiang Dong, Wang Qingling, Wang Xicheng, Li Tieping, Wei Youfeng, Luo Zhongjie. Enhanced Raman Scattering by Nano Gate Electrode[J]. Chinese Journal of Lasers, 2011, 38(11): 1115001
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