• Chinese Journal of Lasers
  • Vol. 32, Issue 4, 519 (2005)
[in Chinese]1、2、*, [in Chinese]1, [in Chinese]1, [in Chinese]1, and [in Chinese]1
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  • 1[in Chinese]
  • 2[in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measuring Near the Diffraction-Limited Wavefront of Semiconductor Laser Beam[J]. Chinese Journal of Lasers, 2005, 32(4): 519 Copy Citation Text show less

    Abstract

    In the semiconductor intersatellite communication system, how to test the laser beams′ quality is difficult. In order to solve this problem, a basal principle of the white light lateral double-shearing interferometer is introduced firstly, and then measuring the semiconductor laser beam′s wavefront which is near the diffraction-limited by the interferometer is reported, and the formula of calculating the beam′s divergence is deduced according to the Fraunhofer diffraction. A 0.2λ wavefront error is gained experimentally. Corresponding to the wavefront error, the divergence angle is only 64.8 μrad, which indicates the beam is near the diffraction-limited. The result shows that the interferometer has high precision and wide practicability.
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measuring Near the Diffraction-Limited Wavefront of Semiconductor Laser Beam[J]. Chinese Journal of Lasers, 2005, 32(4): 519
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