• Chinese Optics Letters
  • Vol. 2, Issue 5, 05308 (2004)
Linjun Wang1、2、*, Yiben Xia1、2, Hujiang Shen1、2, Minglong Zhang1、2, Ying Yang1、2, and Lin Wang1、2
Author Affiliations
  • 1School of Materials Science &
  • 2Engineering, Shanghai University, Shanghai 201800
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    Linjun Wang, Yiben Xia, Hujiang Shen, Minglong Zhang, Ying Yang, Lin Wang. Study for infrared spectroscopic ellipsometric properties of diamond films[J]. Chinese Optics Letters, 2004, 2(5): 05308 Copy Citation Text show less
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    [7] Z. G. Ma, Y. B. Xia, L. J. Wang, Z. J. Fang, W. L. Zhang, and M. L. Zhang, Acta Opti. Sin. (in Chinese) 23, 989 (2003).

    [8] Z. J. Fang, Y. B. Xia, L. J. Wang, Z. W. Wang, W. L. Zhang, and Y. M. Fan, J. Phys. D: Appl. Phys. 35, L57 (2002).

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    CLP Journals

    [1] Yuan Zhao, Mingyu Sheng, Yuxiang Zheng, Liangyao Chen. Accurate analysis of ellipsometric data for thick transparent f ilms[J]. Chinese Optics Letters, 2011, 9(5): 053101

    [2] [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Advance of Optical Chemical Vapor Deposition Diamond Thin Films[J]. Laser & Optoelectronics Progress, 2006, 43(7): 22

    Linjun Wang, Yiben Xia, Hujiang Shen, Minglong Zhang, Ying Yang, Lin Wang. Study for infrared spectroscopic ellipsometric properties of diamond films[J]. Chinese Optics Letters, 2004, 2(5): 05308
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