• Chinese Journal of Lasers
  • Vol. 50, Issue 19, 1911001 (2023)
Yuan Gao1, Lanxiang Sun2、3、4、*, Xiangyu Li1, Ge Xie2、3、4、5, and Yong Xin2、3、4
Author Affiliations
  • 1School of Automation and Electrical Engineering, Shenyang Ligong University, Shenyang 110159, Liaoning , China
  • 2State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110016, Liaoning , China
  • 3Key Laboratory of Networked Control Systems, Chinese Academy of Sciences, Shenyang 110016, Liaoning , China
  • 4Institutes for Robotics and Intelligent Manufacturing, Chinese Academy of Sciences, Shenyang 110169, Liaoning , China
  • 5University of Chinese Academy of Sciences, Beijing 100049, China
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    DOI: 10.3788/CJL221270 Cite this Article Set citation alerts
    Yuan Gao, Lanxiang Sun, Xiangyu Li, Ge Xie, Yong Xin. On-Line Analysis of Sinter Mixture Composition and Correction of Moisture Influence Based on Laser-Induced Breakdown Spectroscopy[J]. Chinese Journal of Lasers, 2023, 50(19): 1911001 Copy Citation Text show less
    Schematic of the system
    Fig. 1. Schematic of the system
    Sample of sinter mixture
    Fig. 2. Sample of sinter mixture
    Relationship between mean spectral lines intensity and moisture mass fraction
    Fig. 3. Relationship between mean spectral lines intensity and moisture mass fraction
    Quantitative analysis of four elements. (a) Quantitative analysis diagram of element Fe; (b) quantitative analysis diagram of element Ca; (c) quantitative analysis diagram of element Si; (d) quantitative analysis diagram of element Mg
    Fig. 4. Quantitative analysis of four elements. (a) Quantitative analysis diagram of element Fe; (b) quantitative analysis diagram of element Ca; (c) quantitative analysis diagram of element Si; (d) quantitative analysis diagram of element Mg
    Errorbar graphs of predicted mass fraction of four elements before spectral standardization. (a) Errorbar diagram of element Fe predicted mass fraction; (b) errorbar diagram of element Ca predicted mass fraction; (c) errorbar diagram of element Si predicted mass fraction; (d) errorbar diagram of element Mg predicted mass fraction
    Fig. 5. Errorbar graphs of predicted mass fraction of four elements before spectral standardization. (a) Errorbar diagram of element Fe predicted mass fraction; (b) errorbar diagram of element Ca predicted mass fraction; (c) errorbar diagram of element Si predicted mass fraction; (d) errorbar diagram of element Mg predicted mass fraction
    RMSE of the predicted each element content corresponding to different sample quantities
    Fig. 6. RMSE of the predicted each element content corresponding to different sample quantities
    RMSE of predicted each element content corresponding to different number of principal componts
    Fig. 7. RMSE of predicted each element content corresponding to different number of principal componts
    RMSE of predicted each element content corresponding to different spectral dimensions
    Fig. 8. RMSE of predicted each element content corresponding to different spectral dimensions
    Comparison between standard spectrum and the spectrum with or without standardization. (a) Comparison between standard spectrum and unstandardized spectrum; (b) comparison between standard spectrum and standardized spectrum
    Fig. 9. Comparison between standard spectrum and the spectrum with or without standardization. (a) Comparison between standard spectrum and unstandardized spectrum; (b) comparison between standard spectrum and standardized spectrum
    RSD of predicted mass fraction of four elements
    Fig. 10. RSD of predicted mass fraction of four elements
    Errorbar graphs of predicted mass fraction of four elements after spectral standardization
    Fig. 11. Errorbar graphs of predicted mass fraction of four elements after spectral standardization
    Yuan Gao, Lanxiang Sun, Xiangyu Li, Ge Xie, Yong Xin. On-Line Analysis of Sinter Mixture Composition and Correction of Moisture Influence Based on Laser-Induced Breakdown Spectroscopy[J]. Chinese Journal of Lasers, 2023, 50(19): 1911001
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