[1] T. P. Nguyen, P. L. Rendu, M Lakehal, D. Kok, D. Vanderzande, A. Bulou, J. P. Bardeau, and P. Joubert, Phys. Stat. Sol. (a) 197, 232 (2003).

[2] H. Li, J. Peng, Y. Yan, and J. Xiang, Acta Physico-Chimica Sin. (in Chinese) 16, 447 (2000).

[3] R. Herino, Mater. Sci. Eng. B 69-70, 70 (2000).

[4] C. Faivre, D. Bellet, and G. Dolino, Thin Solid Films 297, 68 (1997).

[5] K. W. Kolasinski, J. C. Barnard, S. Ganguly, L. Koker, A. Wellner, M. Aindow, R. E. Palmer, C. W. Field, Paul A. Hamley, and M. Poliakoff, J. Appl. Phys. 88, 2472 (2000).

[6] S. P. Duttagupa, X. L. Chen, S. A. Jenekhe, and P. M. Fauchef, Solid State Commun. 101, 33 (1997).

[7] W. Feng, S. Lin, B. Hooker, and A. R. Mickelson, Appl. Opt. 34, 688 (1996).

[8] M. Guendouz, N. Pedrono, R. Etesse, P. Joubert, J. F. Bardeau, A. Bulou, and M. Kloul, Phys. Stat. Sol. (a) 197, 414 (2003).

[9] Z. H. Jia, Acta Photon. Sin. (in Chinese) (to be published).

[10] A. Lakhtakia, B. Michel, and W. S. Weiglhofer, Comp. Sci. Technol. 57, 185 (1997).

[11] E. V. Astrova and V. A. Tolmachev, Mater. Sci. Eng. B 69-70, 142 (2000).