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    Journals >Semiconductor Optoelectronics >Volume 41 >Issue 3 >Page 426 > Article
    • Semiconductor Optoelectronics
    • Vol. 41, Issue 3, 426 (2020)
    Error Analysis of Large Aperture and Thin Beam Auto-collimating Measurement System
    YAO Ming1,2,3 and WANG Jie1,*
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  • 1[in Chinese]
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    DOI: 10.16818/j.issn1001-5868.2020.03.023 Cite this Article
    YAO Ming, WANG Jie. Error Analysis of Large Aperture and Thin Beam Auto-collimating Measurement System[J]. Semiconductor Optoelectronics, 2020, 41(3): 426 Copy Citation Text show less

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    YAO Ming, WANG Jie. Error Analysis of Large Aperture and Thin Beam Auto-collimating Measurement System[J]. Semiconductor Optoelectronics, 2020, 41(3): 426
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