[1] H. Li and Q. Zhang, Acta Opt. Sin. (in Chinese) 27, 907 (2007).
[2] Y. Guan, Chin. Opt. Lett. 6, 465 (2008).
[3] S. M. Seitz, B. Curless, J. Diebel, D. Scharstein, and R. Szeliski, in Proceedings of the 2006 IEEE Computer Society Conference on Computer Vision and Pattern Recognition 1, 519 (2006).
[4] T. Ueshiba, in Proceedings of 18th International Conference on Pattern Recognition 1, 1076 (2006).
[5] G. Vogiatzis, P. H. S. Torr, and R. Cipolla. in Proceedings of IEEE Computer Society Conference on Pattern Recognition 2005 2, 391 (2005).
[6] E. S. Larsen, P. Mordohai, M. Pollefeys, and H. Fuchs, in Proceedings of the Third International Symposium on 3D Data Processing, Visualization, and Transmission 342 (2006).
[7] M.-A. Drouin, M. Trudeau, and S. Roy, in Proceedings of the Fifth International Conference on 3D Digital Imaging and Modeling 540 (2005).
[8] S. B. Kang, R. Szeliski, and J. Chai, in Proceedings of 2001 IEEE Computer Society Conference on Computer Vision and Pattern Recognition 1, 103 (2001).
[9] J. Sun, N.-N. Zheng, and H.-Y. Shum, IEEE Trans. Pattern Anal. Mach. Intell. 25, 787 (2003).
[10] S. Birchfield and C. Tomasi, IEEE Trans. Pattern Anal. Mach. Intell. 20, 401 (1998).
[11] D. Scharstein and R. Szeliski, Int. J. Comput. Vis. 47, 7 (2002).
[12] K.-J. Yoon and I. S. Kweon, IEEE Trans. Pattern Anal. Mach. Intell. 28, 650 (2006).