• High Power Laser and Particle Beams
  • Vol. 33, Issue 5, 054003 (2021)
Tong Wu1、2, Longwei Lai1、3, Luyang Yu1、3, Renxian Yuan1、3, Jian Chen1、3, Yingbing Yan1、3, and Yongbin Leng1、2、3
Author Affiliations
  • 1Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
  • 3Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201210, China
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    DOI: 10.11884/HPLPB202133.210015 Cite this Article
    Tong Wu, Longwei Lai, Luyang Yu, Renxian Yuan, Jian Chen, Yingbing Yan, Yongbin Leng. Design of stripline beam position monitor for Shanghai soft X-ray free electron laser[J]. High Power Laser and Particle Beams, 2021, 33(5): 054003 Copy Citation Text show less

    Abstract

    Shanghai Soft X-ray Free Electron Laser (SXFEL) is the first fourth-generation light source in China that can work in soft X-ray band. With the advantages of short wavelength, full coherence, ultra-high brightness, and ultra-short pulse, it is expected to play an important role in basic science research. Based on the characteristics of the linear accelerator, the stripline beam position monitor (SBPM) was selected as the beam position measurement tool in the injection section and the straight section. The system is mainly composed of the probe, the front-end electronics system, and the digital beam position monitor (DBPM). The design draws on the same type of device from Shanghai Synchrotron Radiation Facility (SSRF) and is further optimized according to the characteristics of SXFEL. Finally, the beam experiment results show that the resolution reaches 5.7 μm@188 pC, which meets the requirements for beam position resolution of SXFEL.
    Tong Wu, Longwei Lai, Luyang Yu, Renxian Yuan, Jian Chen, Yingbing Yan, Yongbin Leng. Design of stripline beam position monitor for Shanghai soft X-ray free electron laser[J]. High Power Laser and Particle Beams, 2021, 33(5): 054003
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