• Electronics Optics & Control
  • Vol. 26, Issue 7, 75 (2019)
XIE Jiang1, CAI Zhongyi2, WANG Zezhou2, and LI Shanshan2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3969/j.issn.1671-637x.2019.07.015 Cite this Article
    XIE Jiang, CAI Zhongyi, WANG Zezhou, LI Shanshan. A Remaining Useful Lifetime Prediction Method for Stochastic Degradation Device Under Accelerated Stress[J]. Electronics Optics & Control, 2019, 26(7): 75 Copy Citation Text show less
    References

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    [7] SI X, CHEN M, WANG W, et al. Specifying measurement errors for required lifetime estimation performance[J]. European Journal of Operational Research, 2013, 231(3): 631-644.

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    [9] TANG S J, GUO X S, YU C Q, et al. Real time remaining useful life prediction based on nonlinear Wiener based degradation processes with measurement errors[J]. Journal of Central South University, 2014, 21(9): 4509-4517.

    [11] SI X S, HU C H, WANG W, et al. Remaining useful life estimation based on a nonlinear diffusion degradation processes[J]. IEEE Transactions on Reliability, 2012, 61(1): 50-57.

    [12] WANG W, CARR M, XU W, et al. A model for remaining life prediction based on Brownian motion with an adaptive drift[J]. Microelectronics Reliability, 2011, 51(2):285-293.

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    XIE Jiang, CAI Zhongyi, WANG Zezhou, LI Shanshan. A Remaining Useful Lifetime Prediction Method for Stochastic Degradation Device Under Accelerated Stress[J]. Electronics Optics & Control, 2019, 26(7): 75
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