• Journal of Applied Optics
  • Vol. 44, Issue 3, 580 (2023)
Liang YUAN1,2,*, Lin'guang YUAN2, Zaitian DONG2, Yan LI2..., Jihong FAN2, Fei LU2, Juncheng ZHAO2, Deng ZHANG2 and Yue YOU2|Show fewer author(s)
Author Affiliations
  • 1School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China
  • 2The First Scale Optical Metrology Station of the Science, Technology and Industry for National Defense, Xi'an Institute of Applied Optics, Xi'an 710065, China
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    DOI: 10.5768/JAO202344.0303002 Cite this Article
    Liang YUAN, Lin'guang YUAN, Zaitian DONG, Yan LI, Jihong FAN, Fei LU, Juncheng ZHAO, Deng ZHANG, Yue YOU. Measurement of normal spectral emissivity of materials at high temperature[J]. Journal of Applied Optics, 2023, 44(3): 580 Copy Citation Text show less
    References

    [15] Department of Electronic Information, General Equipment Department, PLA. Materials coatings - test methods for reflectivity and emissivity - part 2: emissivity GJB5023.2–2003 [S]. Beijing: General Armament Department Military logo Publishing and Distribution Department, 2003.

    [16] National Defense Science,Technology and Industry Level I Metering Station .Calibration specification for infrared material spectral emissivity measurement system: JJF150-2017 [S]. Beijing: State Administration of Science, Technology and Industry for National Defence, 2018.

    Liang YUAN, Lin'guang YUAN, Zaitian DONG, Yan LI, Jihong FAN, Fei LU, Juncheng ZHAO, Deng ZHANG, Yue YOU. Measurement of normal spectral emissivity of materials at high temperature[J]. Journal of Applied Optics, 2023, 44(3): 580
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