[1] G. H. Miller, Proc. SPIE 5341, 1 (2004).

[2] Z. Jiang, Chinese J. Lasers (in Chinese) 33, 1265 (2006).

[3] C. L. Battersby, L. M. Sheehan, and M. R. Kozlowski, Proc. SPIE 3578, 446 (1999).

[4] J. A. Menapace, B. Penetrante, D. Golini, A. Slomba, P. E. Miller, T. Parham, M. Nichols, and J. Peterson, Proc. SPIE 4679, 56 (2002).

[5] J. Huang, H. Lü, L. Ye, S. Zhao, H. Wang, X. Jiang, X. Yang, and W. Zheng, Chinese J. Lasers (in Chinese) 34, 723 (2007).

[6] P. A. Temple, W. H. Lowdermilk, and D. Milam, Appl. Opt. 21, 3249 (1982).

[7] J. Yoshiyama, F. Y. Génin, A. Salleo, I. Thomas, M. R. Kozlowski, L. M. Sheehan, I. D. Hutcheson, and D. W. Camp, Proc. SPIE 3244, 331 (1997).

[8] J. Yang, Y. Zhuang, W. Shen, and Z. Lin, High Power Laser and Particle Beams (in Chinese) 16, 1263 (2004).

[9] ISO 11254-1:2000, Lasers and laser-related equipment — determination of laser-induced damage threshold of optical surfaces — Part 1: 1-on-1 test.

[10] J. Néauport, D. Valla, J. Duchesne, P. Bouchut, L. Lamaignère, J. Bigarré, and N. Daurios, Proc. SPIE 5252, 131 (2004).

[11] F. Y. Génin, A. Salleo , T. V. Pistor, and L. L. Chase, J. Opt. Soc. Am. A 18, 2607 (2001).

[12] M. R. Kozlowski, J. Carr, I. Hutcheon, R. Torres, L. Sheehan, D. Camp, and M. Yan, Proc. SPIE 3244, 365 (1998).

[13] N. Bloembergen, Appl. Opt. 12, 661 (1973).

[14] F. Chen and S. Meng, Progress in Physics (in Chinese) 18, 187 (1998).