LUO Yang, HU Chang-hua, SI Xiao-sheng, ZHANG Zheng-xin, LIU Hao. Remaining Lifetime Prediction by Integrating Stochastic Degradation Process with Hazard Rate[J]. Electronics Optics & Control, 2015, 22(12): 112

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- Electronics Optics & Control
- Vol. 22, Issue 12, 112 (2015)
Abstract

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