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    Journals >Optics and Precision Engineering >Volume 16 >Issue 1 >Page 55 > Article
    • Optics and Precision Engineering
    • Vol. 16, Issue 1, 55 (2008)
    Measurement of defect depth by infrared thermal wave nondestructive evaluation based on pulsed phase
    1, 1, 2, and 2
    Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement of defect depth by infrared thermal wave nondestructive evaluation based on pulsed phase[J]. Optics and Precision Engineering, 2008, 16(1): 55 Copy Citation Text show less
    References

    [2] WUA D,SALERNO A,SCHNBACH B,et al..Phase sensitive modulation thermography and its applications for NDE[J].SPIE,1997,3056:176-183.

    [5] GALMICHE F,LECLERC M,MALDAGUE X.Time aliasing problem in pulsed phased thermography[J].Thermosense XXIII,SPIE,2001,4360:550-553.

    [6] IBARRA-CASTANEDO C,MALDAGUE X.Pulsed phase thermography inversion procedure using normalized parameters to account for defect size variations[J].Thermosense XXVII,SPIE,2005,5782:334-341.

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement of defect depth by infrared thermal wave nondestructive evaluation based on pulsed phase[J]. Optics and Precision Engineering, 2008, 16(1): 55
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