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    Journals >Chinese Journal of Lasers >Volume 12 >Issue 7 >Page 420 > Article
    • Chinese Journal of Lasers
    • Vol. 12, Issue 7, 420 (1985)
    Real-time measurement of lasing spectrum of semiconductor lasers
    Shan Zhenguo
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  • [in Chinese]
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    Shan Zhenguo. Real-time measurement of lasing spectrum of semiconductor lasers[J]. Chinese Journal of Lasers, 1985, 12(7): 420 Copy Citation Text show less

    Abstract

    This paper describes a new method for real-time measurement of lasing spectrum of semiconductor lasers(ES method for short). It is useful particularly for studying characteristics of longitudinal modes and thermal and aging properties of semiconductor lasers.
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    Shan Zhenguo. Real-time measurement of lasing spectrum of semiconductor lasers[J]. Chinese Journal of Lasers, 1985, 12(7): 420
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    Paper Information
    Recommended Topics
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