• Acta Physica Sinica
  • Vol. 69, Issue 14, 146101-1 (2020)
Xiao-Qin Zhu and Yi-Feng Hu*
Author Affiliations
  • School of Mathematics and Physics, Jiangsu University of Technology, Changzhou 213001, China
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    DOI: 10.7498/aps.69.20200502 Cite this Article
    Xiao-Qin Zhu, Yi-Feng Hu. Application of Ge50Te50/Zn15Sb85 nanocomposite multilayer films in high thermal stability and low power phase change memory [J]. Acta Physica Sinica, 2020, 69(14): 146101-1 Copy Citation Text show less
    Resistance vs. temperature of GT/ZS nanocomposite multilayer films.
    Fig. 1. Resistance vs. temperature of GT/ZS nanocomposite multilayer films.
    Failure time vs. 1/(kBT) GT/ZS nanocomposite multilayer films.
    Fig. 2. Failure time vs. 1/(kBT) GT/ZS nanocomposite multilayer films.
    The high-resolution transmission electron microscopy images (a) (b) and selected area electron diffraction diagrams (c) (d) of section for [GT(7 nm)/ZS(3 nm)]5 multilayer composite film: (a), (c) Amorphous; (b), (d) crystalline.
    Fig. 3. The high-resolution transmission electron microscopy images (a) (b) and selected area electron diffraction diagrams (c) (d) of section for [GT(7 nm)/ZS(3 nm)]5 multilayer composite film: (a), (c) Amorphous; (b), (d) crystalline.
    (a) The cross section diagram of PCM devices cell; the curves of (b) I-V, (c) R-V, (d) cycling performance for PCM device based on [GT(7 nm)/ZS(3 nm)]5 multilayer composite film.
    Fig. 4. (a) The cross section diagram of PCM devices cell; the curves of (b) I-V, (c) R-V, (d) cycling performance for PCM device based on [GT(7 nm)/ZS(3 nm)]5 multilayer composite film.
    Xiao-Qin Zhu, Yi-Feng Hu. Application of Ge50Te50/Zn15Sb85 nanocomposite multilayer films in high thermal stability and low power phase change memory [J]. Acta Physica Sinica, 2020, 69(14): 146101-1
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