• Optics and Precision Engineering
  • Vol. 16, Issue 9, 1582 (2008)
JIN Wei-hua1,2,*, JIN Chun-shui1, ZHANG Li-Chao1, ZHU Hong-li1,2, and LIU Lei1,2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    JIN Wei-hua, JIN Chun-shui, ZHANG Li-Chao, ZHU Hong-li, LIU Lei. Determination of optical constants for aluminum thin film based on combined optimal algorism[J]. Optics and Precision Engineering, 2008, 16(9): 1582 Copy Citation Text show less
    References

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    [3] SCHULZ L G.An interferometric method for the determination of the absorption coefficients of metals,with results for silver and aluminum[J].J.Opt.Soc.Am.,1951,41(12):1047-1050

    [4] LARRUQUERT J I,MENDEZ J A,AZNAREZ J A.Far-ultraviolet reflectance measurements and optical constants of unoxidized aluminum films[J].Applied Optics,1995,34(22):4892-4899

    [5] ERIC K L,JANUSZ J,MARK N.In-situ ellipsometric measurements of thin film aluminum oxidation[J].SPIE,4099:218-227

    [8] DOBROWOLSKI J A,HO F C,WALDORF A.Determination of optical constants of thin film coating materials based on inverse synthesis[J].Applied Optics,1983,22(20):3191-3195

    [9] VRIENS L,RIPPENS W.Optical constants of absorbing thin solid films on a substrate[J].Applied Optics,1983,22(24):4105-4110

    [10] NGUYEN H V,COLLINS R W.Optical functions of discontinuous aluminum films-intraband and interband contributions to particle resonance absorption[J].J.Opt.Soc.Am.A.,1993,10(3):515-511

    [11] OUGHADDOU H,VIZZINI S,AUFRAY B,et al..Growth and oxidation of aluminum thin films deposited on Ag (111)[J].Appl.Surf.Sci.,2006,252:4167-4170

    [12] JIN W H,JIN CH SH,ZHU H L,et al..The determination of optical constants of zirconia and silica thin films in the UV to visible range[J].SPIE,2007,6722:67220T-67226T

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    JIN Wei-hua, JIN Chun-shui, ZHANG Li-Chao, ZHU Hong-li, LIU Lei. Determination of optical constants for aluminum thin film based on combined optimal algorism[J]. Optics and Precision Engineering, 2008, 16(9): 1582
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