• Chinese Journal of Lasers
  • Vol. 23, Issue 4, 338 (1996)
[in Chinese]1, [in Chinese]2, [in Chinese]1, and [in Chinese]1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement of the Thickess and Dielectric Constants of Metal Films by Surface Plasma Wave Excited with One Wavelength[J]. Chinese Journal of Lasers, 1996, 23(4): 338 Copy Citation Text show less

    Abstract

    In this paper, the surface plasma wave (SPW) on the interface of medal-electricmedium was excited with one wavelength by using the angle scanning ATR method and thethickness and dielectric constants of metal films were measured by a nonlinear least-squarecure-fitting method.
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement of the Thickess and Dielectric Constants of Metal Films by Surface Plasma Wave Excited with One Wavelength[J]. Chinese Journal of Lasers, 1996, 23(4): 338
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