• Spectroscopy and Spectral Analysis
  • Vol. 33, Issue 11, 2993 (2013)
XIAO Ben-fu1、2、*, YI Li1, WANG Duo-jun3, XIE Chao1, TANG Xue-wu2, LIU Lei1, and CUI Yue-ju1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.3964/j.issn.1000-0593(2013)11-2993-04 Cite this Article
    XIAO Ben-fu, YI Li, WANG Duo-jun, XIE Chao, TANG Xue-wu, LIU Lei, CUI Yue-ju. Genesis Study of Omphacite at High Pressure and High Temperature[J]. Spectroscopy and Spectral Analysis, 2013, 33(11): 2993 Copy Citation Text show less

    Abstract

    The melting and recrystallizing experiments of alkali basalt powder and mixture of pure oxides mixed as stoichiometry were performed at 3 GPa and 1 200 ℃. Electronic microprobe analysis and Raman spectra showed that the recrystallized products were omphacites, the FWHM (full width at half maximum) of the Raman peak was narrow and its shape was sharp, which is attributed to the stable Si—O tetrahedral structure and the high degree of order in omphacite. Based on the results of previous studies, the influencing factors of omphacite genesis and its primary magma were discussed. The results showed that the formation of omphacite could be affected by many factors, such as the composition of parent rocks, the concentration of fluid in the system and the conditions of pressure and temperature. This result could support some experimental evidences on the genesis studies of omphacite and eclogite.
    XIAO Ben-fu, YI Li, WANG Duo-jun, XIE Chao, TANG Xue-wu, LIU Lei, CUI Yue-ju. Genesis Study of Omphacite at High Pressure and High Temperature[J]. Spectroscopy and Spectral Analysis, 2013, 33(11): 2993
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