• Opto-Electronic Engineering
  • Vol. 47, Issue 2, 190635 (2020)
Wang Yang1、2、*, Ma Xiurong1, Qian Sen2、3, Zhu Yao2、4, Wang Zhigang2、3, Gao Feng2、3, Ma Lishuang2、4, Chen Pengyu2、5, Li Haitao2、6, and Gao Bo2、3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • 4[in Chinese]
  • 5[in Chinese]
  • 6[in Chinese]
  • show less
    DOI: 10.12086/oee.2020.190635 Cite this Article
    Wang Yang, Ma Xiurong, Qian Sen, Zhu Yao, Wang Zhigang, Gao Feng, Ma Lishuang, Chen Pengyu, Li Haitao, Gao Bo. The study of test method of time characteristic for ultra-fast-MCP-PMT[J]. Opto-Electronic Engineering, 2020, 47(2): 190635 Copy Citation Text show less

    Abstract

    Study of the time characteristics of photomultiplier tube with ultra-fast time characteristics has an impor-tant guiding role for the further development of ultra-fast time response microchannel plate photomultiplier tube (FPMT). Based on the VME test system in high-energy physics and picosecond laser with single-photon pulse mode,this manuscript designs a device to test the FPMT with 25 ps system error. The time characteristics of various FPMTs were tested by optimizing the FPMT signal readout anode, the voltage divider structure and voltage division ratio. The intrinsic time lower limit value of the FPMT in the non-single-photon working mode, is proposed to compare and analyze the time resolution of different FPMTs in different working states. After completing various optimized readout anode structural design for the FPMTs, it can be find that the best FPMT prototype in our Lab has the best intrinsic time resolution lower limit of 30 ps.
    Wang Yang, Ma Xiurong, Qian Sen, Zhu Yao, Wang Zhigang, Gao Feng, Ma Lishuang, Chen Pengyu, Li Haitao, Gao Bo. The study of test method of time characteristic for ultra-fast-MCP-PMT[J]. Opto-Electronic Engineering, 2020, 47(2): 190635
    Download Citation