• Chinese Optics Letters
  • Vol. 6, Issue 11, 804 (2008)
Liang Liang*, Chao Zhou, and Ling Zhang
Author Affiliations
  • Department of Physics, Xi'an University of Architecture and Technology, Xi'an 710055
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    DOI: 10.3788/COL20080611.0804 Cite this Article Set citation alerts
    Liang Liang, Chao Zhou, Ling Zhang. Energy levels and radiative lifetimes of 3pns 3P0 and 3pnd 3P0 series of Si I[J]. Chinese Optics Letters, 2008, 6(11): 804 Copy Citation Text show less

    Abstract

    The energy levels and lifetimes of 3pns 3P0(n=7-35) and 3pnd 3P0 (n=6-17) series of neutral silicon are calculated and predicted by means of multichannel quantum defect theory (MQDT). In addition, the perturbation caused by core-excited state 3s3p3 is discussed. The 3pnd 3P0 series, especially 3p4d 3P0, 3p5d 3P0, and 3p6d 3P0 are perturbed strongly by the core-excited state 3s3p3 3P0. These cause the lifetime of 3pnd 3P0 (n=5-7) to be less than that of 3p4d 3P0. The lifetimes of 3p14d 3P0 (65479.14 cm-1) and 3p16d 3P0 (65608.77 cm-1) are less than that of their frontal states respectively, because these states are perturbed by 3p22s 3P0 (65476.48 cm-1) and 3p30s 3P0 (65608.99 cm-1) respectively.
    Liang Liang, Chao Zhou, Ling Zhang. Energy levels and radiative lifetimes of 3pns 3P0 and 3pnd 3P0 series of Si I[J]. Chinese Optics Letters, 2008, 6(11): 804
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