Author Affiliations
1School of Material Science and Engineering, Shanghai University, Shanghai 200444, China2Materials Genome Institute, Shanghai University, Shanghai 200444, Chinashow less
Fig. 1. (a) XRD patterns of the hot-pressed BiCuTe
1–xSe
xO (
x = 0, 0.1, 0.2, 0.3, 0.4) samples; (b) cell volume
V; (c) lattice parameter
c; (d) lattice parameter
a as a function of the Se content. The standard XRD pattern of BiCuTeO in (a) is calculated from the Rietveld refinement data given by literature
[23]. The solid lines in (b)−(d) are the linear fitting results of the experiment data.
BiCuTe
1–xSe
xO (
x = 0, 0.1, 0.2, 0.3和0.4) 热压样品的 (a) XRD图谱; (b)晶胞体积
V; (c) 晶格常数
c; (d) 晶格常数
a. 图(a) 中提供的BiCuTeO标准图谱为文献精修数据计算所得
[23]; 图(b)—图(d) 中实线为线性拟合结果
Fig. 2. SEM images of polished samples (the insets are the EDS elemental mapping images) ((a)—(c)) and SEM images of fracture surfaces ((d)−(f))for BiCuTe1–xSexO (x = 0, 0.2, 0.4) compounds.
BiCuTe1–xSexO (x = 0, 0.2和0.4) 抛光样品的SEM图像(插图为相应的EDS面扫描元素分布图像)((a)—(c))以及断面SEM形貌图((d)—(f))
Fig. 3. Temperature dependent electrical transport properties of BiCuTe
1-xSe
xO (
x = 0, 0.1, 0.2, 0.3, 0.4) samples: (a) Electrical conductivity
σ; (b) Seebeck coefficients
S; (c) power factor
S2σ. (d) Se cotent dependence of room temperature hole concentration
n and mobility
. The dashed and dotted lines in (a)−(c) represent the electrical transport properties of undoped BiCuSeO
[14] and BiCuTeO
[23], respectively.
BiCuTe
1-xSe
xO样品 (
x = 0, 0.1, 0.2, 0.3和0.4) 的 (a) 电导率
σ; (b) Seebeck系数
S; (c) 功率因子
S2σ随温度的变化曲线; (d) 样品的载流子浓度
n和迁移率
随Se含量的变化曲线. 图(a)—(c) 中短划线和点划线分别为文献中未掺杂的BiCuTeO
[23]与BiCuSeO
[14]的电输运性能
Fig. 4. Hole concentration
n dependent effective mass
m* of (a) Heavily doped BiCuSeO
[14,16,28] and BiCuTeO
[24,25]; (b) Se doped BiCuTeO (this work) and Te doped BiCuSeO
[28].
(a) 重掺杂BiCuSeO
[14,16,28]和BiCuTeO
[24,25]的载流子有效质量
m*随载流子浓度
n的变化曲线; (b) Se掺杂BiCuTeO(本工作)和Te掺杂BiCuSeO
[28]的载流子有效质量
m*随载流子浓度
n的变化曲线
Fig. 5. Temperature dependent thermal transport properties of BiCuTe
1–xSe
xO (
x = 0, 0.1, 0.2, 0.3, 0.4) samples: (a) Total thermal conductivity; (b) the combination of lattice and bipolar thermal conductivity, and the electronic thermal conductivity. The dashed and dotted lines in (a) represent the total thermal conductivities of undoped BiCuTeO
[23] and BiCuSeO
[14], respectively.
BiCuTe
1–xSe
xO (
x = 0, 0.1, 0.2, 0.3和0.4) 样品的(a) 总热导率和(b) 电子热导率、晶格热导率与双极扩散热导率之和随温度的变化曲线. 图(a)中短划线和点划线分别为未掺杂的BiCuTeO
[23]与BiCuSeO
[14]的热输运性能
Fig. 6. Temperature dependent
zT values of BiCuTe
1–xSe
xO (
x = 0, 0.1, 0.2, 0.3, 0.4) samples. The dashed and dotted lines represent the
zT values of undoped BiCuTeO
[23] and BiCuSeO
[14], respectively.
BiCuTe
1–xSe
xO (
x = 0, 0.1, 0.2, 0.3和0.4)样品的
zT值随温度的变化曲线. 短划线和点划线分别为未掺杂的BiCuTeO
[23]与BiCuSeO
[14]的zT值
样品 | 载流子浓度n/cm–3 | 迁移率
${\mu}$![]() /cm2·V–1·s–1 | 电导率σ/Sm–1 | m*/m0 | BiCuTeO | 8.4 × 1019 | 28.2 | 3.81 × 104 | 2.42 | BiCuTe0.9Se0.1O
| 7.0 × 1019 | 11.8 | 1.32 × 104 | 2.94 | BiCuTe0.8Se0.2O
| 6.3 × 1019 | 7.9 | 7.89 × 103 | 3.07 | BiCuTe0.7Se0.3O
| 5.1 × 1019 | 4.0 | 3.31 × 103 | 3.2 | BiCuTe0.6Se0.4O
| 5.8 × 1019 | 1.9 | 1.73 × 103 | 4.28 |
|
Table 1. Room temperature carrier concentrations (n), Hall mobilities (
), electrical conductivities (σ) and effective masses of BiCuTe1–xSexO (x = 0, 0.1, 0.2, 0.3, 0.4) samples.
室温下BiCuTe1–xSexO (x = 0, 0.1, 0.2, 0.3和0.4) 样品的载流子浓度 (n)、迁移率 (
)、电导率 (σ) 以及载流子有效质量 (m*)