Author Affiliations
1College of Physics and Electronic Engineering, Shanxi University, Taiyuan, Shanxi 0 30006, China2Collaborative Innovation Center of Extreme Optics, Shanxi University, Taiyuan, Shanxi 0 30006, Chinashow less
Fig. 1. Energy level structure of atomic system and position relation between fields and atomic system. (a) Four-level N-type atomic system; (b) spatial configuration of probe, modulation, and coupling fields with respect to atomic sample in which zeroth-order, first-order and second-order diffraction directions are indicated
Fig. 2. Transmission function and corresponding diffraction intensity of probe field when Δc=0, Δm=0.68γ, Δp=-0.05γ, Ωc=0.27γ, Ωm=0.35γ, and L=140z0 . (a) Amplitude and phase of transmission function of probe field versus x; (b) diffraction intensity versus sin θ under different phase modulation conditions; (c) part with zeroth-order diffraction int
Fig. 3. Im (χ) versus Rabi frequencies of modulation field and coupling field when Δc=0, Δm=0.68γ, Δp=-0.05γ, and L=140z0. (a) Im (χ) versus Rabi frequency of modulation field; (b) Im (χ) versus Rabi frequency of coupling field
Fig. 4. High-order diffraction intensity versus Ωc and Ωm when Δc=0, Δm=0.68γ, Δp=-0.05γ, and L=140z0.(a) First-order diffraction intensity; (b) second-order diffraction intensity; (c) third-order diffraction intensity
Fig. 5. High-order diffraction intensity versus Δp and Δm when Δc=0, Ωc=0.27γ, Ωm=0.33γ, and L=140z0. (a) First-order diffraction intensity; (b) second-order diffraction intensity; (c) third-order diffraction intensity
Fig. 6. First-order diffraction intensity versus Ωm for different L when sin θ1=0.25, Δc=0, Δm=0.68γ, Δp=-0.05γ, Ωc=0.27γ, and L=140z0