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    Journals >Chinese Journal of Lasers >Volume 32 >Issue 4 >Page 523 > Article
    • Chinese Journal of Lasers
    • Vol. 32, Issue 4, 523 (2005)
    Method of Measuring Practical Retardance Value and Judging the Fast or Slow Axis of Quarter-Wave Plate
    [in Chinese]*, [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Method of Measuring Practical Retardance Value and Judging the Fast or Slow Axis of Quarter-Wave Plate[J]. Chinese Journal of Lasers, 2005, 32(4): 523 Copy Citation Text show less
    References

    [7] R. C. Jones. A new calculus for the treatment of optical systems: Ⅰ;Ⅱ;Ⅲ [J]. J. Opt. Soc. Am., 1941, 31(7): 488～503

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Method of Measuring Practical Retardance Value and Judging the Fast or Slow Axis of Quarter-Wave Plate[J]. Chinese Journal of Lasers, 2005, 32(4): 523
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