• Chinese Journal of Lasers
  • Vol. 17, Issue 9, 538 (1990)
[in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese]. Decay of space-charge field in ps photorefractive effect in which EL2 level associate in GaAs[J]. Chinese Journal of Lasers, 1990, 17(9): 538 Copy Citation Text show less

    Abstract

    The intensity of phase conjugation signal versus time decay has been measured using optical DFWM method. It has been found that there are a faster decay signal and a lower one. It showes that the decay of space-charge field is very slow and it can persist for a time of ns scale.
    [in Chinese], [in Chinese], [in Chinese]. Decay of space-charge field in ps photorefractive effect in which EL2 level associate in GaAs[J]. Chinese Journal of Lasers, 1990, 17(9): 538
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