Optical properties and adhesion of Ag films with Cr interlayer of different thickness on glass substrates were investigated by using spectrophotometer and X-ray diffraction (XRD). The spectra results showed that the reflectivity of Ag films increased with the thickness of Cr interlayer increasing from 8 to 17 nm and then decreased with increasing Cr film thickness to 24 nm. Compared with pure Ag films on glass substrates, the reflectivity of Ag films with 17～21 nm Cr interlayer was higher and that of Ag films with 8～14 nm and 24 nm Cr interlayer was lower. Thus, the reflectivity of Ag film can be promoted by introducing a certain thickness of Cr interlayer. The XRD analysis showed that with a certain thickness of Cr interlayer, the crystalline grains increased, intergranular defects and scattering decreased, and so the strain decreased. The adhesion was also improved by using the tape test method.