Researching

Journals
  • Advanced Photonics
  • Photonics Insights
  • Advanced Photonics Nexus
  • Photonics Research
  • Advanced Imaging
  • View All Journals
  • Chinese Optics Letters
  • High Power Laser Science and Engineering
    • Articles
  • Optics
  • Physics
  • Geography
  • View All Subjects
    • Conferences
  • CIOP
  • HPLSE
  • AP
  • View All Events
    • News
    About CLP
    Search by keywords or author
    Journals >Optics and Precision Engineering >Volume 16 >Issue 5 >Page 771 > Article
    • Optics and Precision Engineering
    • Vol. 16, Issue 5, 771 (2008)
    Application of ray tracing method to birefringent filter error analysis
    1,2, 1, 1, 1, and 1
    Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
    • show less
    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Application of ray tracing method to birefringent filter error analysis[J]. Optics and Precision Engineering, 2008, 16(5): 771 Copy Citation Text show less

    Abstract

    作者简介：王东光(1966-),女,北京人,高级工程师,主要从事偏振光学和计量光学的研究.E-mail:wdg@bao.ac.cn
    Abstract
    Get PDF
    Figures&Tables (0)
    Equations (0)
    References (2)
    Get Citation
    Copy Citation Text
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Application of ray tracing method to birefringent filter error analysis[J]. Optics and Precision Engineering, 2008, 16(5): 771
    Download Citation
    Tools
    Share
    Save the article for my favorites
    Paper Information
    Recommended Topics
    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology