• Infrared Technology
  • Vol. 43, Issue 6, 583 (2021)
Jianbo ZHONG*, Maozhong LI, Qingsong XIA, Yongfang LUO, Yuchao JIA, Caiping WANG, Hongbin LI, Hong LUO, and Pan HUANG
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  • [in Chinese]
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    DOI: Cite this Article
    ZHONG Jianbo, LI Maozhong, XIA Qingsong, LUO Yongfang, JIA Yuchao, WANG Caiping, LI Hongbin, LUO Hong, HUANG Pan. Fast Focal Length Measurement Method based on Infrared Lens Images[J]. Infrared Technology, 2021, 43(6): 583 Copy Citation Text show less
    References

    [2] Ohtsu N. A threshold selection method from gray-level histograms[J]. IEEE Transactions on Systems Man & Cybernetics, 1979, 9(1): 62-66.

    [3] Imocha Singh, Tejmani Sinam. Local contrast and mean based thresholding technique in image binarization[J]. International Journal of Serial number Certification agency results/mm Our results /mm Absolute error percentage Computer Applications, 2012, 51(6): 5-10.

    [6] Gábor Domokos, Zsolt Lángi, Márk Mezei. A shape evolution model under affine transformations[J/OL][2017-09-18]. arXiv:1604.07630 (https://arxiv.org/ abs/1604.07630v2) http://opticsjournal.net/Articles/abstract?aid=OJ180321000199IeKhNk

    ZHONG Jianbo, LI Maozhong, XIA Qingsong, LUO Yongfang, JIA Yuchao, WANG Caiping, LI Hongbin, LUO Hong, HUANG Pan. Fast Focal Length Measurement Method based on Infrared Lens Images[J]. Infrared Technology, 2021, 43(6): 583
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