[1] J. Y. Natoli, B. Bertussi, and M. Commandre, Opt. Lett. 30, 1315 (2005).

[2] F. R. Wagner, A. Hildenbrand, L. Gallais, H. Akhouayri, M. Commandre, and J. Y. Natoli, Proc. SPIE 7132, 71320Y (2008).

[3] S. C. Jones, P. Braunlich, R. T. Casper, X. A. Shen, and P. Kelly, Opt. Eng. 28, 1039 (1989).

[4] A. A. Manenkov and V. S. Nechitailo, Proc. SPIE 1441, 392 (1991).

[5] Y. Zhao, W. Gao, J. Shao, and Z. Fan, Appl. Surf. Sci. 227, 275 (2004).

[6] M. Mero, B. Clapp, J. C. Jasapara, W. Rudolph, D. Ristau, K. Starke, J. Kruger, S. Martin, and W. Kautek, Opt. Eng. 44, 051107 (2005).

[7] A. S. Epifanov, IEEE J. Quantum Electron. 17, 2018 (1981).

[8] N. Bloembergen, IEEE J. Quantum Electron. 10, 375 (1974).

[9] R. W. Hopper and D. R. Uhlmann, J. Appl. Phys. 41, 4023 (1970).

[10] Y. Wang, H. He, Y. Zhao, Y. Shan, D. Li, and C. Wei, Chin. Opt. Lett. 9, 023103 (2011).

[11] ISO11254-2, "Lasers and laser-related equipment-determination of laser-induced damage threshold of optical surfaces-Part 2", in s-on-1 test (2000).

[12] ISO11254-1, "Lasers and laser-related equipment-determination of laser-induced damage threshold of optical surfaces-Part 1", in 1-on-1 test (2000).

[13] K. Starke, D. Ristau, H. Welling, T. V. Amotchkina, M. Trubetskov, A. A. Tikhonravov, and A. S. Chirkin, Proc. SPIE 5273, 501 (2004).

[14] L. A. Emmert, M. Mero, and W. Rudolph, J. Appl. Phys. 108, 043523 (2010).

[15] M. Mero, L. A. Emmert, and W. Rudolph, Proc. SPIE 7132, 713209 (2008).

[16] Y. Wang, Y. Zhao, Y. Shan, J. Shao, and Z. Fan, Chin. Opt. Lett. 9, 093102 (2011).

[17] L. V. Keldysh, Sov. Phys. JETP 20, 1307 (1965).

[18] L. Yuan, Y. Zhao, C. Wang, H. He, Z. Fan, and J. Shao, Appl. Surf. Sci. 253, 3450 (2007).

[19] L. Sudrie, A. Couairon, M. Franco, B. Lamouroux, B. Prade, S. Tzortzakis, and A. Mysyrowicz, Phys. Rev. Lett. 89, 186601 (2002).