• Acta Photonica Sinica
  • Vol. 52, Issue 12, 1212003 (2023)
Lu YE1,2, Xiangchao ZHANG1,*, Junhua WANG1, Min XU1, and Liehua ZHENG2
Author Affiliations
  • 1Shanghai Engineering Research Center of Ultra-precision Optical Manufacturing,Fudan University,Shanghai 200438,China
  • 2Shanghai Institute of Technical Physics,Chinese Academy of Sciences,Shanghai 200083,China
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    DOI: 10.3788/gzxb20235212.1212003 Cite this Article
    Lu YE, Xiangchao ZHANG, Junhua WANG, Min XU, Liehua ZHENG. High Precision Deflectometric Measurement Based on Pinhole Camera with an External Stop[J]. Acta Photonica Sinica, 2023, 52(12): 1212003 Copy Citation Text show less
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    Lu YE, Xiangchao ZHANG, Junhua WANG, Min XU, Liehua ZHENG. High Precision Deflectometric Measurement Based on Pinhole Camera with an External Stop[J]. Acta Photonica Sinica, 2023, 52(12): 1212003
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