• Chinese Journal of Lasers
  • Vol. 12, Issue 3, 165 (1985)
Shi Zhilang and Huang Xianlie
Author Affiliations
  • [in Chinese]
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    Shi Zhilang, Huang Xianlie. Measurement of refractive index profile of selfoc rod lenses by holographic interference microscopy[J]. Chinese Journal of Lasers, 1985, 12(3): 165 Copy Citation Text show less
    References

    [1] B. C. Wonsiewicz et al.;Appl. OpJ.,1976,15,1048.

    [2] A. M. Hunter II et al.; Appl.Opt., 1975, 14,634.

    [3] T. Okoshi, K. Hotate; Appl. Opt., 1976, 15, 2756.

    [4] W. Eickhoff, E. Weidel; Opt. Quant. Electron., 1975, 7, 109.

    [5] D. Marcuse, H. M. Pxesby; Appl. Opt., 1979, 18, 14.

    [8] K. Snow, E. Vandewarkei; Appl. Opt., 1968, 7, 549.

    Shi Zhilang, Huang Xianlie. Measurement of refractive index profile of selfoc rod lenses by holographic interference microscopy[J]. Chinese Journal of Lasers, 1985, 12(3): 165
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