[1] X. Cao, W. Huang, and T. Jin, (eds.) Metrological Technique by Gratings (in Chinese) (Zhejiang University Press, Hangzhou, 1992) pp.261-297.
[2] X. Ma, Y. Fei, X. Chen, G. Li, and J. Quan, Instrument Technique and Sensor (in Chinese) (4) 53 (2006).
[3] W. Yu, X. Hu, and Z. Zou, Journal of Tianjin University (in Chinese) 35, 1 (2002).
[4] X. Li, S. Huang, Y. Zhang, and Z. Feng, Modern Manufacturing Engineering (in Chinese) (6) 83 (2004).
[5] M. Dobosz, Opt. Eng. 38, 968 (1999).
[6] J.-H. Song, K.-C. Kim, and S. H. Kim, Rev. Sci. Instrum. 71, 2296 (2000).
[7] F. Gindele, F. Gaul, S. Kraus, S. Sigloch, and U. Teubner, Proc. SPIE 5459, 254 (2004).
[8] T. Tang, X. Cao, H. Chen, and B. Lin, Chin. Opt. Lett. 3, 80 (2005).
[9] J. Xu, X. Ni, X. Cao, and Z. Lu, Optical Instruments 28, (3) 56 (2006).
[10] H. Huo, (ed.) Digital Image Processing (in Chinese) (China Machine Press, Beijing, 1992) pp.148-152.
