Closely interleaved self-comparison method applied to precise measurement

Fan Zou; Rong Wei; Richang Dong; Tingting Chen; Wenli Wang; Yuzhu Wang

doi:10.3788/COL201614.081201

Journals >Chinese Optics Letters >Volume 14 >Issue 8 >Page 081201 > Article

Chinese Optics Letters
Vol. 14, Issue 8, 081201 (2016)

Closely interleaved self-comparison method applied to precise measurement

Fan Zou^1、2, Rong Wei^1、*, Richang Dong^1、2, Tingting Chen^1、2, Wenli Wang¹, and Yuzhu Wang¹

Author Affiliations

¹Key Laboratory of Quantum Optics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

²University of Chinese Academy of Sciences, Beijing 100049, China

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DOI: 10.3788/COL201614.081201 Cite this Article Set citation alerts

Fan Zou, Rong Wei, Richang Dong, Tingting Chen, Wenli Wang, Yuzhu Wang. Closely interleaved self-comparison method applied to precise measurement[J]. Chinese Optics Letters, 2016, 14(8): 081201 Copy Citation Text

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Fan Zou, Rong Wei, Richang Dong, Tingting Chen, Wenli Wang, Yuzhu Wang. Closely interleaved self-comparison method applied to precise measurement[J]. Chinese Optics Letters, 2016, 14(8): 081201

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