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    Journals >Experiment Science and Technology >Volume 22 >Issue 4 >Page 13 > Article
    • Experiment Science and Technology
    • Vol. 22, Issue 4, 13 (2024)
    X-ray Detection Efficiency Study Based on Silicon Pixel Detector
    Jun LIU1, Chenfei YANG2, Shengtai LI1, Qiang YUAN1..., Kai JIN1 and Xiangming SUN1,*|Show fewer author(s)
    Author Affiliations
  • 1Key Laboratory of Quark and Lepton Physics (MOE), Central China Normal University, Wuhan 430079, China
  • 2i-TEK OptoElectronics Co., Ltd., Hefei 230000, China
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    DOI: 10.12179/1672-4550.20230498 Cite this Article
    Jun LIU, Chenfei YANG, Shengtai LI, Qiang YUAN, Kai JIN, Xiangming SUN. X-ray Detection Efficiency Study Based on Silicon Pixel Detector[J]. Experiment Science and Technology, 2024, 22(4): 13 Copy Citation Text show less
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    Jun LIU, Chenfei YANG, Shengtai LI, Qiang YUAN, Kai JIN, Xiangming SUN. X-ray Detection Efficiency Study Based on Silicon Pixel Detector[J]. Experiment Science and Technology, 2024, 22(4): 13
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