Experimental method for the extraction of intensity profiles by imaging the scattered pattern with a charge-coupled device

Haixia Li; Meina Zhang; Xiaoyi Chen; Chunxiang Liu; Chuanfu Cheng

doi:10.3788/col201210.052901

Journals >Chinese Optics Letters >Volume 10 >Issue 5 >Page 052901 > Article

Chinese Optics Letters
Vol. 10, Issue 5, 052901 (2012)

Experimental method for the extraction of intensity profiles by imaging the scattered pattern with a charge-coupled device

Haixia Li, Meina Zhang, Xiaoyi Chen, Chunxiang Liu, and Chuanfu Cheng

DOI: 10.3788/col201210.052901 Cite this Article Set citation alerts

Haixia Li, Meina Zhang, Xiaoyi Chen, Chunxiang Liu, Chuanfu Cheng. Experimental method for the extraction of intensity profiles by imaging the scattered pattern with a charge-coupled device[J]. Chinese Optics Letters, 2012, 10(5): 052901 Copy Citation Text

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