• Chinese Optics Letters
  • Vol. 14, Issue 4, 042401 (2016)
Zhitao Yang1、2、*, Changjian Liu2, Yachen Gao1、3、**, Jiyu Wang2, and Wenlong Yang2
Author Affiliations
  • 1Postdoctoral Mobile Research Station of the School of Electronic Engineering, Heilongjiang University, Harbin 150080, China
  • 2School of Applied Sciences, Harbin University of Science and Technology, Harbin 150080, China
  • 3Key Laboratory of Electronics Engineering, College of Heilongjiang Province, Heilongjiang University, Harbin 150080, China
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    DOI: 10.3788/COL201614.042401 Cite this Article Set citation alerts
    Zhitao Yang, Changjian Liu, Yachen Gao, Jiyu Wang, Wenlong Yang. Influence of surface roughness on surface plasmon resonance phenomenon of gold film[J]. Chinese Optics Letters, 2016, 14(4): 042401 Copy Citation Text show less
    Configuration of the angle-modulation SPR measurement.
    Fig. 1. Configuration of the angle-modulation SPR measurement.
    Reflection Intensity of small-angle x ray scattering from the gold film.
    Fig. 2. Reflection Intensity of small-angle x ray scattering from the gold film.
    Surface morphology images of samples detected by AFM.
    Fig. 3. Surface morphology images of samples detected by AFM.
    SPR measurement of samples with different surface roughness.
    Fig. 4. SPR measurement of samples with different surface roughness.
    Data of resonance angle versus RMS-roughness and the results of the fitting.
    Fig. 5. Data of resonance angle versus RMS-roughness and the results of the fitting.
    SampleAnnealing temperature (°C)RMS- roughness (nm)Resonance angle (°)Resonance depth
    11001.26044.040.0976
    22000.90643.940.0935
    33000.70043.750.0947
    44000.41543.650.1160
    Table 1. Results of Surface RMS-Roughness and SPR of Samples
    Zhitao Yang, Changjian Liu, Yachen Gao, Jiyu Wang, Wenlong Yang. Influence of surface roughness on surface plasmon resonance phenomenon of gold film[J]. Chinese Optics Letters, 2016, 14(4): 042401
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