• Chinese Journal of Lasers
  • Vol. 43, Issue 3, 302002 (2016)
You Kewei1、2、*, Zhang Yanli1, Zhang Xuejie1, Zhang Junyong1, and Zhu Jianqiang1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/cjl201643.0302002 Cite this Article Set citation alerts
    You Kewei, Zhang Yanli, Zhang Xuejie, Zhang Junyong, Zhu Jianqiang. Analysis of Near-Field Modulations Caused by Defects in High Power Laser System[J]. Chinese Journal of Lasers, 2016, 43(3): 302002 Copy Citation Text show less

    Abstract

    In high power laser device, near- field beam quality is evaluated through the intensity distribution. However, the measured distribution is a steady state, which can not reflect the evolution features of intensity modulation caused by noise disturbances. Some area encountering serious intensity modulation may be ignored in transmission process. Near-field transmission characteristics of the beam disturbed by noise disturbance are studied. Meanwhile, deeper understanding of the limitations of the measured near-field intensity distribution is obtained. To simplify the analysis of the near-field intensity distribution at different distance under the influence of single local defect, the characteristics of near-field intensity modulation is represented by equivalent Fresnel number. The results show that once a weak modulated information appears in the distribution of measured nearfield intensity, there may be a more serious modulation area before the measurement position. A highest modulation can be up to nine times for a phase type defects with π delay corresponding to incident intensity.
    You Kewei, Zhang Yanli, Zhang Xuejie, Zhang Junyong, Zhu Jianqiang. Analysis of Near-Field Modulations Caused by Defects in High Power Laser System[J]. Chinese Journal of Lasers, 2016, 43(3): 302002
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