• Electronics Optics & Control
  • Vol. 28, Issue 9, 89 (2021)
HAN Lu, SHI Xianjun, LONG Yufeng, and ZHAI Yuyao
Author Affiliations
  • [in Chinese]
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    DOI: 10.3969/j.issn.1671-637x.2021.09.019 Cite this Article
    HAN Lu, SHI Xianjun, LONG Yufeng, ZHAI Yuyao. A Test Optimization Selection Method Based on MOPSO-NSGA2 Algorithm[J]. Electronics Optics & Control, 2021, 28(9): 89 Copy Citation Text show less

    Abstract

    Test optimization selection is an important step in testability design.This paper mainly studies the test optimization selection problem under the condition of unreliable test.Firstlythe problem is reduced to a multi-objective problem for analysis.On this basisthe mathematical model of the problem is established with the test quantitytest cost and false alarm rate as the objectivesand the fault detection rate and isolation rate as the constraints.Thenbased on the Bayesian network testability modelthe MOPSO-NSGA2 algorithm is used to solve the problem.Finallythe method is used to make test optimization selection for the radio altimeter of a certain missileand a comparison is made with MOPSO algorithm and NSGA-2 algorithm.The results verify the effectiveness and feasibility of the method.
    HAN Lu, SHI Xianjun, LONG Yufeng, ZHAI Yuyao. A Test Optimization Selection Method Based on MOPSO-NSGA2 Algorithm[J]. Electronics Optics & Control, 2021, 28(9): 89
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