[1] W. Dickson, S. Takahashi, R. Pollard, R. Atkinson, and A. V. Zayats, IEEE Trans. Nanotechnology 4, 229 (2005).

[2] J. Zweck, T. Zimmermann, and T. Schuhrke, Ultramicroscopy 67, 153 (1997).

[3] H. P. Oepen and J. Kirschner, Phys. Rev. Lett. 62, 819 (1989).

[4] A. Thiaville, L. Belliard, D. Majer, E. Zeldov, and J. Miltat, J. Appl. Phys. 82, 3182 (1997).

[5] A. Hubert and R. Sch afer, Magnetic Domains (Springer-Verlag, Berlin, 1998).

[6] D. W. Pohl, W. Denk, and M. Lanz, Appl. Phys. Lett. 44, 651 (1984).

[7] B. Hecht, B. Sick, U. P. Wild, V. Deckert, R. Zenobi, O. J. F. Martin, and D. W. Pohl, J. Chem. Phys. 112, 7761(2000).

[8] J. Kim and K. Song, Micros. of Nonostructures 38, 409 (2007).

[9] L. Huang, Z. Wang, Z. Li, and W. Deng, Chin. Opt. Lett. 7, 472 (2009)

[10] E. Betzig, J. K. Trautman, R. Wolfe, E. M. Gyorgy, P. L. Finn, M. H. Kryder, and C. H. Chang, Appl. Phys. Lett. 61, 142 (1992).

[11] G. Meyer, T. Crecelius, A. Bauer, I. Mauch, and G. Kaindl, Appl. Phys. Lett. 83, 1394 (2003).

[12] C. Durkan, I. V. Shvets, and J. C. Lodder, Appl. Phys. Lett. 70, 1323 (1997).

[13] S. Takahashi, W. Dickson, R. Pollard, and A. Zayats, Ultramicroscopy 100, 443 (2004).

[14] W. Dickson, S. Takahashi, R. Pollard, R. Atkinson, and A. V. Zayats, J. Microsc. 209, 194 (2003).

[15] G. Zoriniants, D. Englund, O. Kurnosikov, C. F. J. Flipse, E. Riedo, H. Brune, W. J. M. de Jonge, and B. Koopmans, in Proceedings of 12th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques 204 (2003).

[16] K. Karrai and R. D. Grober, Appl. Phys. Lett. 66, 1842 (1995).

[17] G. Y. Shang, C. Wang, J. Wu, C. L. Bai, and F. H. Lei, Rev. Sci. Instrum. 72, 2344 (2001).

[18] H. J. Hug, A. Moser, T. Jung, O. Fritz, A. Wadas, I. Parashikov, and H.-J. Guntherodt, Rev. Sci. Instrum. 64, 2920 (1993).

[19] G. Meyer, T. Crecelius, G. Kaindl, and A. Bauer, J. Magn. Magn. Mater. 240, 76 (2002).

[20] M. Ohtsu, Progress in Nano-Electro-Optics IV (Springer-Verlag, Berlin, 2005).