• Semiconductor Optoelectronics
  • Vol. 44, Issue 4, 623 (2024)
YAN Bozhao, CUI Bifeng, CHEN Fen, CHEN Zhongbiao..., ZHENG Xiangrui, YANG Chunpeng, WANG Qing and GAO Xinyu|Show fewer author(s)
Author Affiliations
  • Key Lab of Opto-Electronics Technol of The Ministry of Education, Faculty of Information Technol, Beijing University of Technol, Beijing 100124, CHN
  • show less
    DOI: 10.16818/j.issn1001-5868.2024030401 Cite this Article
    YAN Bozhao, CUI Bifeng, CHEN Fen, CHEN Zhongbiao, ZHENG Xiangrui, YANG Chunpeng, WANG Qing, GAO Xinyu. Study on the Improvement of Facet Characteristics of High-Power Semiconductor Lasers[J]. Semiconductor Optoelectronics, 2024, 44(4): 623 Copy Citation Text show less

    Abstract

    To address the instability of the front cavity surface under high current, which can lead to catastrophic optical mirror damage (COMD), a semiconductor laser with a dual-zone electrode structure was proposed. This study investigated the COMD threshold, peak power, threshold current, spectral stability, and kink effect of this laser structure. Under the same process conditions, the COMD threshold, peak power, threshold current, and wavelength redshift rate of semiconductor lasers with a single-electrode structure and dual-zone electrode structure were tested. The results showed that, under the same process conditions, with a threshold current of 80 mA in the main gain region, the threshold current of the laser with the dual-zone electrode structure was reduced by 20%. When driven by a 15 mA current in the window region, compared to the single-electrode semiconductor laser, the semiconductor laser with the dual-zone electrodes could increase the COMD threshold by 13%, increase the peak power by 12%, and decrease the wavelength redshift while improving the kink effect.
    YAN Bozhao, CUI Bifeng, CHEN Fen, CHEN Zhongbiao, ZHENG Xiangrui, YANG Chunpeng, WANG Qing, GAO Xinyu. Study on the Improvement of Facet Characteristics of High-Power Semiconductor Lasers[J]. Semiconductor Optoelectronics, 2024, 44(4): 623
    Download Citation