• Chinese Journal of Lasers
  • Vol. 45, Issue 1, 103002 (2018)
Li Meixuan1、2、*, Wang Li1, and Dong Lianhe1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/CJL201845.0103002 Cite this Article Set citation alerts
    Li Meixuan, Wang Li, Dong Lianhe. Development of a Novel Optical Variable Attenuator in Lithography Exposure System[J]. Chinese Journal of Lasers, 2018, 45(1): 103002 Copy Citation Text show less
    Schematic of lithography exposure system
    Fig. 1. Schematic of lithography exposure system
    Structure diagram of the new optical variable attenuator. (a) Two-dimensional structure; (b) three-dimensional structure
    Fig. 2. Structure diagram of the new optical variable attenuator. (a) Two-dimensional structure; (b) three-dimensional structure
    Relationship between transmittance of attenuation films and incident angle
    Fig. 3. Relationship between transmittance of attenuation films and incident angle
    Relationship between reflectance of antireflective films and incident angle
    Fig. 4. Relationship between reflectance of antireflective films and incident angle
    Relationship between wavelength and reflectance of antireflective films
    Fig. 5. Relationship between wavelength and reflectance of antireflective films
    Test schematic of optical variable attenuator transmittance
    Fig. 6. Test schematic of optical variable attenuator transmittance
    Transmittance of attenuator at different incident angles
    Fig. 7. Transmittance of attenuator at different incident angles
    Optional materialRefractive indexTransparent area /μmMelting point /℃Evaporation temperature /℃
    MgF21.40-1.450.11-1012661540
    AlF31.40-1.450.2-20890900
    SiO21.45-1.550.2-917001600
    LaF31.60-1.650.2-1214901490
    CaF21.65-1.750.3-514601350
    Al2O31.70-1.800.2-820202100
    Table 1. Characteristic of common coating materials for 193 nm wavelength
    Li Meixuan, Wang Li, Dong Lianhe. Development of a Novel Optical Variable Attenuator in Lithography Exposure System[J]. Chinese Journal of Lasers, 2018, 45(1): 103002
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