XIE Chao, DU Jian-guo, LIU Lei, YI Li, LIU Hong, CHEN Zhi, LI Jing. In Situ Raman Spectrum Peak Test of Monocrystalline Silicon Wafer under Quantitative Uniaxial Pressure[J]. Spectroscopy and Spectral Analysis, 2016, 36(4): 1261
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