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    Journals >INFRARED >Volume 43 >Issue 7 >Page 15 > Article
    • INFRARED
    • Vol. 43, Issue 7, 15 (2022)
    Study on InSb Infrared Detectors Failure Mechanism Based on Reliability Test
    Wei-ting ZHANG*, Ti NI, Zhong-he LI, and Chun-ling LI
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    DOI: 10.3969/j.issn.1672-8785.2022.07.003 Cite this Article
    ZHANG Wei-ting, NI Ti, LI Zhong-he, LI Chun-ling. Study on InSb Infrared Detectors Failure Mechanism Based on Reliability Test[J]. INFRARED, 2022, 43(7): 15 Copy Citation Text show less
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    ZHANG Wei-ting, NI Ti, LI Zhong-he, LI Chun-ling. Study on InSb Infrared Detectors Failure Mechanism Based on Reliability Test[J]. INFRARED, 2022, 43(7): 15
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