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    Journals >Semiconductor Optoelectronics >Volume 44 >Issue 4 >Page 562 > Article
    • Semiconductor Optoelectronics
    • Vol. 44, Issue 4, 562 (2023)
    Parameter Estimations of Three-Parameter Weibull Distribution for LED Lamps Under Constant Stress Accelerated Test
    XU Xiaoling1,*, GU Beiqing1, and WANG Ronghua2
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  • 2[in Chinese]
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    DOI: 10.16818/j.issn1001-5868.2023042001 Cite this Article
    XU Xiaoling, GU Beiqing, WANG Ronghua. Parameter Estimations of Three-Parameter Weibull Distribution for LED Lamps Under Constant Stress Accelerated Test[J]. Semiconductor Optoelectronics, 2023, 44(4): 562 Copy Citation Text show less
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    XU Xiaoling, GU Beiqing, WANG Ronghua. Parameter Estimations of Three-Parameter Weibull Distribution for LED Lamps Under Constant Stress Accelerated Test[J]. Semiconductor Optoelectronics, 2023, 44(4): 562
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