Fault Diagnosis of Reliability Test for Low-Light-Level Vision Device Based on Structural Similarity Algorithm

Yongtao LI; Yalei HE; Fengling WU

Journals >Infrared Technology >Volume 43 >Issue 9 >Page 889 > Article

Infrared Technology
Vol. 43, Issue 9, 889 (2021)

Fault Diagnosis of Reliability Test for Low-Light-Level Vision Device Based on Structural Similarity Algorithm

Yongtao LI^*, Yalei HE, and Fengling WU

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[in Chinese]

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LI Yongtao, HE Yalei, WU Fengling. Fault Diagnosis of Reliability Test for Low-Light-Level Vision Device Based on Structural Similarity Algorithm[J]. Infrared Technology, 2021, 43(9): 889 Copy Citation Text

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References

[4] ZHOU Wang, A C Bovik. A universal image quality index[J]. IEEE Signal Processing Letters, 2002, 9(3): 81-84.

[5] ZHOU Wang, A C Bovik, H R Sheikh, et al. Image quality assessment: from error visibility to structural similarity[J]. IEEE Transactions on Image processing, 2004, 13(4): 600-612.

[6] XU W, Hauske G. Picture quality evaluation based on error segmentation[J]. Proc SPIE, 1994, 2308(2308): 1454-1465.

LI Yongtao, HE Yalei, WU Fengling. Fault Diagnosis of Reliability Test for Low-Light-Level Vision Device Based on Structural Similarity Algorithm[J]. Infrared Technology, 2021, 43(9): 889

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