• Optics and Precision Engineering
  • Vol. 30, Issue 21, 2639 (2022)
Runze QI, Jinlong ZHANG, Qiushi HUANG, Zhong ZHANG, and Zhanshan WANG*
Author Affiliations
  • Institute of Precision Optical Engineering, MOE Key Laboratory of Advanced Micro-Structured Materials, Shanghai Frontiers Science Center of Digital Optics, Shanghai Professional Technical Service Platform for Full-Spectrum and High-Performance Optical Thin Film Devices and Applications,School of Physics Science and Engineering, Tongji University, Shanghai200092, China
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    DOI: 10.37188/OPE.20223021.2639 Cite this Article
    Runze QI, Jinlong ZHANG, Qiushi HUANG, Zhong ZHANG, Zhanshan WANG. Research progress of multilayer optical elements in extreme ultraviolet and vacuum ultraviolet[J]. Optics and Precision Engineering, 2022, 30(21): 2639 Copy Citation Text show less
    Reflectivity curves at different positions of Mo/Si multilayer sample in range of 210 mm×40 mm[53]
    Fig. 1. Reflectivity curves at different positions of Mo/Si multilayer sample in range of 210 mm×40 mm53
    (a) Diffraction curves and (b) experimental reflectivity curves of Al(w(Si)=1%)/Zr and Al(Pure)/Zr multilayers
    Fig. 2. (a) Diffraction curves and (b) experimental reflectivity curves of Al(w(Si)=1%)/Zr and Al(Pure)/Zr multilayers
    Relative surface roughness of Al(w(Si)=1%)/Zr multilayers as a function of annealing temperatures
    Fig. 3. Relative surface roughness of Al(w(Si)=1%)/Zr multilayers as a function of annealing temperatures
    Theoretical reflectivity curves of Al/Mo/B4C multilayers at different solar lines
    Fig. 4. Theoretical reflectivity curves of Al/Mo/B4C multilayers at different solar lines
    Reflective performance of [Al/Mo/B4C]/SiC and Mo/Si multilayers
    Fig. 5. Reflective performance of [Al/Mo/B4C]/SiC and Mo/Si multilayers
    EUV reflectivity curves of Mg/SiC multilayer introducing different thicknesses of Zr barrier layers[62]
    Fig. 6. EUV reflectivity curves of Mg/SiC multilayer introducing different thicknesses of Zr barrier layers62
    Cross-section TEM images of Mg/Co multilayer[62]
    Fig. 7. Cross-section TEM images of Mg/Co multilayer62
    (a) EUV reflectivity curves of Mg/Zr multilayers at different annealing temperatures; (b) Relationship between normalized reflectivity and annealing temperatures of different Mg-based multilayers[62]
    Fig. 8. (a) EUV reflectivity curves of Mg/Zr multilayers at different annealing temperatures; (b) Relationship between normalized reflectivity and annealing temperatures of different Mg-based multilayers62
    High resolution TEM bright field images of Sc/Si multilayers
    Fig. 9. High resolution TEM bright field images of Sc/Si multilayers
    EUV reflectivity curve of Sc/Si multilayer with γSc=0.65
    Fig. 10. EUV reflectivity curve of Sc/Si multilayer with γSc=0.65
    Theoretical reflectivity curves of Yb/Al multilayers introducing different thicknesses of SiC surface layer
    Fig. 11. Theoretical reflectivity curves of Yb/Al multilayers introducing different thicknesses of SiC surface layer
    Theoretical and measured reflectivity curves of Yb/Al multilayer prepared under 4×10-5 Pa background vacuum at Ne I 73.59 nm wavelength
    Fig. 12. Theoretical and measured reflectivity curves of Yb/Al multilayer prepared under 4×10-5 Pa background vacuum at Ne I 73.59 nm wavelength
    Reflectivity curves of Al+eMgF2 mirrors (a) and Al+eLiF mirrors (b) prepared at different substrate temperatures
    Fig. 13. Reflectivity curves of Al+eMgF2 mirrors (a) and Al+eLiF mirrors (b) prepared at different substrate temperatures
    Reflectivity curves of LaF3/MgF2 film in 105-130 nm wavelength range
    Fig. 14. Reflectivity curves of LaF3/MgF2 film in 105-130 nm wavelength range
    Reflectivity curves of LaF3/MgF2 film in 105-130 nm wavelength range
    Fig. 15. Reflectivity curves of LaF3/MgF2 film in 105-130 nm wavelength range
    Reflectivity curves of Mo / Si aperiodic broadband multilayer measured at NSRL and BESSY II stations[90]
    Fig. 16. Reflectivity curves of Mo / Si aperiodic broadband multilayer measured at NSRL and BESSY II stations90
    Reflectivity curves with wavelength range (a) and with grazing angle (b) of Mo / Si aperiodic broadband multilayer measured at BSRF stations[90]
    Fig. 17. Reflectivity curves with wavelength range (a) and with grazing angle (b) of Mo / Si aperiodic broadband multilayer measured at BSRF stations90
    Polarization efficiency and measured reflectivities of Mo/Y multilayer broadband polarizer[86]
    Fig. 18. Polarization efficiency and measured reflectivities of Mo/Y multilayer broadband polarizer86
    Calculated and fitted phase shifts and measured transmission as function of wavelength at grazing incidence angles of 47°and 54°[90]
    Fig. 19. Calculated and fitted phase shifts and measured transmission as function of wavelength at grazing incidence angles of 47°and 54°90
    Circular radiation from BESSY UE56/1-PGM beamline as functions of wavelength
    Fig. 20. Circular radiation from BESSY UE56/1-PGM beamline as functions of wavelength
    Runze QI, Jinlong ZHANG, Qiushi HUANG, Zhong ZHANG, Zhanshan WANG. Research progress of multilayer optical elements in extreme ultraviolet and vacuum ultraviolet[J]. Optics and Precision Engineering, 2022, 30(21): 2639
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