• INFRARED
  • Vol. 41, Issue 4, 20 (2020)
Zheng-lin ZHANG*, Jin-cheng CHEN, and Yu-ge HAN
Author Affiliations
  • [in Chinese]
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    DOI: 10.3969/j.issn.1672-8785.2020.04.004 Cite this Article
    ZHANG Zheng-lin, CHEN Jin-cheng, HAN Yu-ge. Inversion Method of Rough Surface Parameters Based on Polarization Measurement[J]. INFRARED, 2020, 41(4): 20 Copy Citation Text show less
    References

    [3] Thilak V, Voelz D G, Creusere C D, et al. Estimating the Complex Index of Refraction and View Angle of an Object using Multiple Polarization Measurements[C]. SPIE, 2009, 6240: 624004.

    [4] Thilak V, Voelz D G, Creusere C D. Polarization-Based Index of Refraction and Reflection Angle Estimation for Remote Sensing Applications[J]. Applied Optics, 2007, 46(30): 7527-7536.

    [7] Lei G, Wu Z S, Hou H L. Polarized Bidirectional Reflectance Distribution Function for Optical Substrate and Different Films[C]. SPIE, 2012, 8417: 84170J.

    [8] Torrance K E, Sparrow E M. Theory for Off-Specular Reflection From Roughened Surfaces[J]. Journal of the Optical Society of America, 1967, 57(9): 1105-1114.

    [9] Meyers J P. Modeling Polarimetric Imaging Using DIRSIG[D]. Rochester:Rochester Institute of Technology, 2002.

    [10] Zhuan S X, Wu W, Huang Y, et al. Establishment and Simulation of Simplified Polarimetric BRDF Model Based on MB Model[J]. Infrared and Laser Engineering, 2015, 44(3): 1098-1102.

    [12] Index of Refraction: Fixed and Variable Ratio at Given Wavelength[EB/OL]. http://www.luxpop.com/HU_v174.cgiOpCode=73, 2019. http://opticsjournal.net/Articles/abstract?aid=OJ151022000101cIeLhO

    ZHANG Zheng-lin, CHEN Jin-cheng, HAN Yu-ge. Inversion Method of Rough Surface Parameters Based on Polarization Measurement[J]. INFRARED, 2020, 41(4): 20
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