• Optics and Precision Engineering
  • Vol. 32, Issue 17, 2625 (2024)
Qian LIU*, Le MI, and Xiaojin HUANG
Author Affiliations
  • Institute of Machinery Manufacturing Technology, China Academy of Engineering Physics, Mianyang621999, China
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    DOI: 10.37188/OPE.20243217.2625 Cite this Article
    Qian LIU, Le MI, Xiaojin HUANG. White-light interferometry immune to vibration disturbance over wide frequency region[J]. Optics and Precision Engineering, 2024, 32(17): 2625 Copy Citation Text show less
    Flowchart of three-point arcsine algorithm
    Fig. 1. Flowchart of three-point arcsine algorithm
    Sketch of calculating scannig increment
    Fig. 2. Sketch of calculating scannig increment
    Scanning increment calculation error with linear disturbance
    Fig. 3. Scanning increment calculation error with linear disturbance
    Scanning increment calculation error with sinusoidal disturbance
    Fig. 4. Scanning increment calculation error with sinusoidal disturbance
    Scanning increment calculation error with random disturbance
    Fig. 5. Scanning increment calculation error with random disturbance
    Calculated scanning increment with 3P-Asin algorithm
    Fig. 6. Calculated scanning increment with 3P-Asin algorithm
    Residual errors of reconstructed topography of step
    Fig. 7. Residual errors of reconstructed topography of step
    Captured one interferogram of measuring step
    Fig. 8. Captured one interferogram of measuring step
    Calculated scanning increment
    Fig. 9. Calculated scanning increment
    Measured profiles of step (Insets are enlarged profiles circled with dashed lines)
    Fig. 10. Measured profiles of step (Insets are enlarged profiles circled with dashed lines)
    Measured step heights
    Fig. 11. Measured step heights
    Diverse surface reconstructed with 3P-Asin algorithm
    Fig. 12. Diverse surface reconstructed with 3P-Asin algorithm
    Measured step heights under sinusoidal disturbances with different amplitudes
    Fig. 13. Measured step heights under sinusoidal disturbances with different amplitudes
    MethodLinearSinusoidalRandom
    +50% error-50% errorLow frequencyHigh frequency
    3P-Asin0.0500.0500.0751.96.3
    Six-point0.1700.4600.2209.27.4
    Table 1. RMSE of scanning increment calculation with different disturbances
    Qian LIU, Le MI, Xiaojin HUANG. White-light interferometry immune to vibration disturbance over wide frequency region[J]. Optics and Precision Engineering, 2024, 32(17): 2625
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