• Journal of Terahertz Science and Electronic Information Technology
  • Vol. 22, Issue 12, 1364 (2024)
DONG Yayun1, CUI Zhitong1, DU Chuanbao1, NIE Xin1..., LIU Yifei1, WANG Wenzhuo2 and ZHENG Shengquan2|Show fewer author(s)
Author Affiliations
  • 1National Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi'an Shaanxi 710024, China
  • 2China Ship Development and Design Center, Wuhan Hubei 430064, China
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    DOI: 10.11805/tkyda2023092 Cite this Article
    DONG Yayun, CUI Zhitong, DU Chuanbao, NIE Xin, LIU Yifei, WANG Wenzhuo, ZHENG Shengquan. Experimental study on pulse current injection method for short-wave antenna port[J]. Journal of Terahertz Science and Electronic Information Technology , 2024, 22(12): 1364 Copy Citation Text show less
    References

    [1] GIRI D V, HOAD R, SABATH F. High-power electromagnetic effects on electronic systems[M]. London: Artech, 2020: 20-30.

    [2] BACKSTROM M G, LOVSTRAND K G. Susceptibility of electronic systems to high-power microwaves: summary of test experience[J]. IEEE Transactions on Electromagnetic Compatibility, 2004, 46(3): 396-403. doi: 10.1109/TEMC.2004.831814.

    [5] U.S. Department of Defense. High-altitude EMP protection for transportable systems: MIL-STD-188-125-2[S]. 1999.

    DONG Yayun, CUI Zhitong, DU Chuanbao, NIE Xin, LIU Yifei, WANG Wenzhuo, ZHENG Shengquan. Experimental study on pulse current injection method for short-wave antenna port[J]. Journal of Terahertz Science and Electronic Information Technology , 2024, 22(12): 1364
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