Intelligent Optimization Design for Test Stimulus of Nonlinear Analog Circuits

WU Shi-hao; MENG Ya-feng

doi:10.3969/j.issn.1671-637x.2019.01.004

Journals >Electronics Optics & Control >Volume 26 >Issue 1 >Page 17 > Article

Electronics Optics & Control
Vol. 26, Issue 1, 17 (2019)

Intelligent Optimization Design for Test Stimulus of Nonlinear Analog Circuits

WU Shi-hao^1、2 and MENG Ya-feng¹

Author Affiliations

¹[in Chinese]

²[in Chinese]

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DOI: 10.3969/j.issn.1671-637x.2019.01.004 Cite this Article

WU Shi-hao, MENG Ya-feng. Intelligent Optimization Design for Test Stimulus of Nonlinear Analog Circuits[J]. Electronics Optics & Control, 2019, 26(1): 17 Copy Citation Text

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References

[5] EVANS C, REES D, JONES I, et al.Periodic signals for measuring nonlinear Volterra kernels［J］.IEEE Transactions and Measurement, 1996, 45(2):362-371.

[10] HAN H T, MA H G, TAN L N, et al.Non-parametric identification method of Volterra kernels for nonlinear systems excited by multitone signal［J］.Asian Journal of Control, 2013, 16(2):519-529.

WU Shi-hao, MENG Ya-feng. Intelligent Optimization Design for Test Stimulus of Nonlinear Analog Circuits[J]. Electronics Optics & Control, 2019, 26(1): 17

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